| Zugriffsnummer | 40745 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Uncertainty propagation and evaluation of nano-scale stray field in quantitative magnetic force microscopy measurements |
| Autor(in); Institution |
Hu, Xiukun; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Dai, Gaoliang; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Sievers, Sibylle; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Schumacher, Hans Werner; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Neu, Volker; IFW, Dresden, GERMANY
|
| Quelle/Jahr | 2018 Conference on Precision Electromagnetic Measurements:(2018), 992 - 993 |
| Artikelnummer | 18193036 |
| Availability | [online only] |
| ISSN | 2160-0171 (ELECTRONIC) ; 0589-1485 (POD) |
| ISBN | 978-1-5386-0974-3 (PDF) ; 978-1-5386-0973-6 (USB) ; 978-1-5386-2130-1 (PoD) |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements ; CPEM 2018, Paris, 8-13, July, 2018, France |
| Freie Schlagworte | stray field ; magnetic force microscopy ; Wiener deconvolution filter ; uncertainty evaluation |
| Zusammenfassung | It is essential for a traceable magnetic field calibration to understand how data processing methods impact the final result. Here, we report a quantitative nano-scale magnetic stray field characterization method, which is based on phase images measured by magnetic force microscopy, combined with a magnetic tip calibration procedure and Wiener deconvolution in Fourier domain. We discuss components and propagation of uncertainties in the tip calibration procedure and in the stray field calculation. An evaluation procedure is proposed and the measurement uncertainty of the stray field for a test sample SmCo5 is evaluated. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |
| Forschungsprojekt | 15SIB06: NanoMag: Nano-scale traceable magnetic field measurements |
| Förderinformationen (1) |
Förderername: European Commission (EC)
Förderer ID: 0000 0001 2242 8989 Förderer ID Typ: ISNI Förderprogramm: EMPIR 2015 SI Broader Scope Titel der Förderung: 15SIB06: NanoMag: Nano-scale traceable magnetic field measurements Förderungsnummer: 15SIB06 |
Zitierung
Hu, X., Dai, G., Sievers, S., Schumacher, H. W., & Neu, V. (2018). Uncertainty propagation and evaluation of nano-scale stray field in quantitative magnetic force microscopy measurements. Conference on Precision Electromagnetic Measurements ; CPEM 2018, Paris, 8-13, July, 2018, France. https://doi.org/10.1109/cpem.2018.8501050