Zugriffsnummer 40720
Dokumenttyp Zeitschriftenartikel Open Access Gold
Peer Review mit Peer Review
Sprache Englisch
Titel Investigation of a small force standard with the mass based method
Autor(in); Institution
Gang, Hu; National Institute of Metrology, Beijing, CHINA
Jiang, Jile; National Institute of Metrology, Beijing, CHINA
Zhang, Zhimin; National Institute of Metrology, Beijing, CHINA
Zhang, Yue; National Institute of Metrology, Beijing, CHINA
Brand, Uwe; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
Kim, Min-Seok; Korea Research Institute of Standards andScience (KRISS), Daejeon, REPUBLIC OF KOREA 
Quelle/Jahr Acta IMEKO: 6 (2017), 2, 13 - 20
Availability [online only]
ISSN 2221-870X
DOI
Verlag Braunschweig: International Measurement Confederation
Freie Schlagworte Small Force ; Electromagnetic compensation balance ; Nano-Positioning stage ; Cantilevers ; Atomic force microscope
Zusammenfassung A small force standard with the mass based method is developed. It is composed of an electromagnetic compensation balance, a nano‐positioning stage and a displacement and pitch angle adjustment unit. The small force standard is used to measure spring constants of cantilevers in Atomic Force Microscope (AFM) and forces of small force transducers in related applications. Since the balance and the nano‐positioning stage are traced to mass and length standards, respectively, the small force standard is SI traceable. The principle and structure of the small force standard and its main components are discussed in detail. The spring constants of several cantilevers used in AFM were calibrated by the small force standard. The calibration results are demonstrated and uncertainties are evaluated. For verifying metrological characteristics of the small force standard, a preliminary international comparison between NIM, PTB and KRISS was carried out. The comparison results were in good agreement and indicate that the calibration capabilities of the participating small force standards were equivalent within their reported uncertainties.
Kostenfreier Zugang Open Access Gold
Rechteinformation CC BY 3.0 ; Creative Commons Attribution 3.0 License
Themenbereich der Metrologie Masse und abgeleitete Größen

Zitierung

Gang, H., Jiang, J., Zhang, Z., Zhang, Y., Brand, U., & Kim, M.-S. (2017). Investigation of a small force standard with the mass based method. Acta IMEKO, 6(2), 13–20. http://doi.org/10.21014/acta_imeko.v6i2.389

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