| Zugriffsnummer | 40522 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Secondary electrons in ion gauges |
| Autor(in); Institution |
Grosse, Gottfried; 9.24, Vakuumphysik, PTB-Berlin
Harten, U.; 9.24, Vakuumphysik, PTB-Berlin
Jitschin, Wolfgang; 9.24, Vakuumphysik, PTB-Berlin
Gentsch, H.; Institut für Physikalische Chemie, Universität Essen, Essen, GERMANY
|
| Quelle/Jahr | Journal of Vacuum Science and Technology A: 5 (1987), 5, 3242 - 3243 |
| ISSN | 0734-2101 |
| DOI | |
| Verlag | New York, NY: AVS |
| Zusammenfassung | The secondary electron emission induced by the electron impact on grid materials of ionization gauges has been studied. It makes up for about 10% of the sensitivity of the gauge. Changes in the chemical composition of the grid result in changes of the secondary electron yield and thus in changes of the gauge sensitivity amounting up to several percent. Gold and carbon constitute especially stable surfaces. |
