| Zugriffsnummer | 40517 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | X‐ray and Auger‐electron yields for quantitative element analysis |
| Autor(in); Institution |
Jitschin, Wolfgang; 9.24, Vakuumphysik, PTB-Berlin
Werner, U.; Fakultät für Physik, Universität Bielefeld, Bielefeld, GERMANY
|
| Quelle/Jahr | Journal of Vacuum Science and Technology A: 5 (1987), 4, 1203 - 1205 |
| ISSN | 0734-2101 |
| DOI | |
| Verlag | New York, NY: AIP |
| Zusammenfassung | Quantitative analytical work frequently relies on calibration measurements in which empirical parameters are determined whose interconnection to basic physical properties is unsatisfactory. In contrast, the fundamental processes of x‐ray absorption and emission are known with reasonable accuracy a priori and are insensitive to the state of matter. The present paper discusses recent results on these inner‐shell processes obtained with synchrotron radiation. Absorption cross sections show a smooth energy dependence by a power law; minor dispersion like deviations from this behavior due to electron correlations are now established. Precise x‐ray and Auger yields can be determined by a novel technique in which the fluorescence is detected for various primary energies in the realm of the absorption edges. |
| Themenbereich der Metrologie | Thermometrie |