Zugriffsnummer 40495
Dokumenttyp Zeitschriftenartikel
Peer Review mit Peer Review
Sprache Englisch
Titel Resonant grazing-incidence small-angle x‑ray scattering at the sulfur K‑edge for material-specific investigation of thin-film nanostructures
Autor(in); Institution
Coric, Mihael; Munich School of Engineering, Technische Universita\̈t Mu\̈nchen, Garching, GERMANY
Saxena, Nitin; Physik-Department, Lehrstuhl fu\̈r Funktionelle Materialien, Technische Universita\̈t Mu\̈nchen, Garching, GERMANY
Pflüger, Mika; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Müller-Buschbaum, Peter; Physik-Department, Lehrstuhl fu\̈r Funktionelle Materialien, Technische Universita\̈t Mu\̈nchen, Garching, GERMANY
Krumrey, Michael; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Herzig, Eva M.; Munich School of Engineering, Technische Universita\̈t Mu\̈nchen, Garching, GERMANY; Physikalisches Institut, Dynamik und Strukturbildung \−Herzig Group, Universita\̈t Bayreuth, Bayreuth, GERMANY
Quelle/Jahr The Journal of Physical Chemistry Letters:(2018), 9, 3081 - 3086
Availability [online only]
ISSN 1948-7185
DOI
Verlag American Chemical Society (ACS)
Zusammenfassung Scattering techniques are a powerful tool for probing thin-film nanomorphologies but often require additional characterization by other methods. We applied the well-established grazing-incidence small-angle X-ray scattering (GISAXS) technique for a selection of energies around the absorption edge of sulfur to exploit the resonance effect (grazing incidence resonant tender X-ray scattering, GIR-TeXS) of the sulfur atoms within a poly(3-hexylthiophene-2,5-diyl):phenyl-C61-butyric acid methyl ester (P3HT:PC61BM) sample to gain information about the composition of the film morphology. With this approach, it is possible not only to identify structures within the investigated thin film but also to link them to a particular material combination.
Themenbereich der Metrologie Photometrie und Radiometrie

Zitierung

Coric, M., Saxena, N., Pflüger, M., Müller-Buschbaum, P., Krumrey, M., & Herzig, E. M. (2018). Resonant grazing-incidence small-angle x‑ray scattering at the sulfur K‑edge for material-specific investigation of thin-film nanostructures. The Journal of Physical Chemistry Letters, 3081–3086. https://dx.doi/10.1021/acs.jpclett.8b01111

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