| Zugriffsnummer | 39897 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Determining spectrum-dependent source and detector positions in cone-beam CT |
| Autor(in); Institution |
Illemann, Jens; 5.3, Koordinatenmesstechnik, PTB-Braunschweig
Neuschaefer-Rube, Ulrich; 5.3, Koordinatenmesstechnik, PTB-Braunschweig
Bartscher, Markus; 5.3, Koordinatenmesstechnik, PTB-Braunschweig
Bate, David; Nikon Metrology Ltd, Tring, UK
|
| Quelle/Jahr | 8th Conference on Industrial Computed Tomography (iCT) 2018: proceedings:(2018), 8 S. |
| Availability | [online only] |
| URL | |
| Verlag | Bad Breisig: NDT.net |
| Konferenzangaben | iCT Conference 2018 - 8th Conference on Industrial Computed Tomography, Wels, 06-09, February, 2018, Austria |
| Freie Schlagworte | magnification ; source position ; detector position ; X-ray spectrum dependence ; traceability |
| Zusammenfassung | In cone-beam computed tomography, the reconstruction process is usually described solely by the source-to-object distance (SOD) and the source-to-detector distance (SDD). The ratio of these two distances determines the magnification and thus defines the length scale. In a previous work (1), the authors proposed considering the finite thickness of the detector's sensitive layer and the finite penetration depth of the electrons into the target of the X-ray source. Initial experimental results of the absorption spectrum-dependent variation of the SDD were shown. In this article, a new method is introduced in which - by means of a laser interferometer and a calibrated perforated thin metal foil - the positions of the source, the object and the effective detector plane can be determined absolutely depending on the source cathode voltage with an accuracy of a few micrometres. This enables the quantitative evaluation of the spectral dependence of these positions for a possible future correction. (1) J. llemann et al., "X-ray spectrum dependence of the magnification of cone-beam CT", ICT 2017 |
