| Zugriffsnummer | 39563 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Differences between bulk and surface electronic structure of doped TiO2 with soft-elements (C, N and S) |
| Autor(in); Institution |
Sa, Jacinto; Institute of Physical Chemistry, Polish Academy of Sciences, Warsaw, POLAND; Department of Chemistry, Uppsala University, SWEDEN
Garlisi, C.; Khalifa Univ. of Science and Tech. Abu Dhabi, UAE
Palmisano, G.; Khalifa Univ. of Science and Tech. Abu Dhabi, UAE
Czapla-Masztafiak, J.; Institute of Nuclear Physics, Krakow, POLAND
Kayser, Yves; 7.2, Kryophysik und Spektrometrie, PTB-Berlin
Szlachetko, Jakub; Institute of Physical Chemistry, Polish Academy of Sciences, Warsaw, POLAND; Department of Chemistry, Uppsala University, SWEDEN
|
| Quelle/Jahr | Materials Chemistry and Physics: 208 (2018), 281 - 288 |
| ISSN | 0254-0584 (PRINT) ; 1879-3312 (ONLINE) |
| DOI | |
| Verlag | Amsterdam: Elsevier |
| Freie Schlagworte | TiO2 doping ; Electronic structure analysis ; Surface vs bulk |
| Zusammenfassung | Herein, we report a systematic study on the electronic structure of surface and bulk TiO2 doped with C, N or S. The results were attained with a semi-empirical method consisting of a combination between resonant X-ray emission spectroscopy (RXES) measurements and localized density of states (LDOS) simulations. Experimental TiO2 RXES data was used to fit FEFF code empirical parameters, and subsequently frozen for the theoretical analysis of LDOS of TiO2 doped materials. The results show significant electronic structure differences between bulk and surface doping, as well as in the nearest Ti atom electronic structure if it is located at the surface or sub-surface, with potential consequences to the photo-catalytic process. The methodology can be adapted to study other dopants, as well as other inorganic semiconductors. |
Zitierung
Sa, J., Garlisi, C., Palmisano, G., Czapla-Masztafiak, J., Kayser, Y., & Szlachetko, J. (2018). Differences between bulk and surface electronic structure of doped TiO₂ with soft-elements (C, N and S). Materials Chemistry and Physics, 208, 281–288. https://doi.org/10.1016/j.matchemphys.2018.01.041