| Zugriffsnummer | 39447 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Measuring silicon pore optics |
| Autor(in); Institution |
Vacanti, G.; cosine Science & Computing BV, Warmond, THE NETHERLANDS
Barrière, N.; cosine Science & Computing BV, Warmond, THE NETHERLANDS
Bavdaz, M.; European Space Research and Technology Ctr., Noordwijk, THE NETHERLANDS
Chatbi, A.; cosine Science & Computing BV, Warmond, THE NETHERLANDS
Collon, M.J.; cosine Research BV, Warmond, THE NETHERLANDS
Dekker, D.; cosine Science & Computing BV, Warmond, THE NETHERLANDS
Girou, D.; cosine Science & Computing BV, Warmond, THE NETHERLANDS
Günther, R.; cosine Science & Computing BV, Warmond, THE NETHERLANDS
van der Hoeven, R.; cosine Science & Computing BV, Warmond, THE NETHERLANDS
Krumrey, Michael; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Landgraf, B.; cosine Science & Computing BV, Warmond, THE NETHERLANDS
Müller, Peter; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Schreiber, Swenja; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Vervest, M.; cosine Science & Computing BV, Warmond, THE NETHERLANDS
Wille, E.; European Space Research and Technology Ctr., Noordwijk, THE NETHERLANDS
|
| Quelle/Jahr | Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII:(2017), 103990N-1 - 103990N-6 |
| Schriftenreihe | Proceedings of SPIE: 10399 |
| Herausgeber(in) |
O'Dell, Stephen L.
Pareschi, Giovanni
|
| ISSN | 0277-786X |
| ISBN | 978-1-5106-1255-6 |
| DOI | |
| Verlag | Bellingham, Wash.: SPIE |
| Konferenzangaben | SPIE Optics + Photonics, San Diego, Calif., 8-10 August, 2017, USA |
| Freie Schlagworte | X-ray optics ; X-ray astronomy ; silicon pore optics ; X-ray telescopes ; X-ray testing ; ray tracing |
| Zusammenfassung | While predictions based on the metrology (local slope errors and detailed geometrical details) play an essential role in controlling the development of the manufacturing processes, X-ray characterization remains the ultimate indication of the actual performance of Silicon Pore Optics (SPO). For this reason SPO stacks and mirror modules are routinely characterized at PTB's X-ray Pencil Beam Facility at BESSY II. Obtaining standard X-ray results quickly, right after the production of X-ray optics is essential to making sure that X-ray results can inform decisions taken in the lab. We describe the data analysis pipeline in operations at cosine, and how it allows us to go from stack production to full X-ray characterization in 24 hours. |
Zitierung
Vacanti, G., Barrière, N., Bavdaz, M., Chatbi, A., Collon, M., Dekker, D., Girou, D., Günther, R., van der Hoeven, R., Krumrey, M., Landgraf, B., Müller, P., Schreiber, S., Vervest, M., & Wille, E. (2017). Measuring silicon pore optics. SPIE Optics + Photonics, San Diego, Calif., 8-10 August, 2017, USA. https://doi.org/10.1117/12.2274357