Zugriffsnummer 39353
Dokumenttyp Konferenzartikel
Sprache Englisch
Titel BRDF variability of typical diffuse reflectance standards between 380 nm and 1700 nm
Autor(in); Institution
Ferrero, Alejandro; Instituto de Optica Daza de Valdes (IO-CSIC), Agencia Estatal CSIC, Madrid, SPAIN
Strothkämper, Christian; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Bernad, Berta; Instituto de Optica Daza de Valdes (IO-CSIC), Agencia Estatal CSIC, Madrid, SPAIN
Quast, Tatjana; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Hauer, Kai-Olaf; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Campos, Joaquin; Instituto de Optica Daza de Valdes (IO-CSIC), Agencia Estatal CSIC, Madrid, SPAIN
Pons Aglio, Alicia; Instituto de Optica Daza de Valdes (IO-CSIC), Agencia Estatal CSIC, Madrid, SPAIN
Schirmacher, Alfred; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Quelle/Jahr 13th International Conference on New Developments and Applications in Optical Radiometry (NEWRAD 2017): Proceedings:(2017), 240 - 241
Availability [USB-Stick]
Verlag [s.l.]:
Konferenzangaben 13th International Conference on New Developments and Applications in Optical Radiometry (NEWRAD 2017), Tokyo, 13-16, June, 2017, Japan
Zusammenfassung Comparison of the reflectance properties of different diffuse reflectance standards provides guide to select the standard most adequate for a given application. IO-CSIC and PTB have studied the variation of the spectral BRDF with respect to the standard bidirectional geometry 0°:45° of the four most typical diffuse reflectance standards (barium sulphate, opal glass, ceramic tile and Spectralon), within the spectral range [380-1700] nm. IO-CSIC measured the variation in-plane spectral BRDF at several incidence angles, whereas PTB measured its out-ouf-plane variation at a fixed 45° incidence angle.

Zitierung

Ferrero, A., Strothkämper, C., Bernad, B., Quast, T., Hauer, K.-O., Campos, J., Pons Aglio, A., & Schirmacher, A. (2017). BRDF variability of typical diffuse reflectance standards between 380 nm and 1700 nm. 13th International Conference on New Developments and Applications in Optical Radiometry (NEWRAD 2017), Tokyo, 13-16, June, 2017, Japan.

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