| Zugriffsnummer | 39351 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Multiple Transfer Standard for calibration and characterisation of test setups in industry |
| Autor(in); Institution |
Sperling, Armin; 4.1, Photometrie und angewandte Radiometrie, PTB-Braunschweig
Meyer, Maic; 4.1, Photometrie und angewandte Radiometrie, PTB-Braunschweig
Gerloff, Thorsten; 4.1, Photometrie und angewandte Radiometrie, PTB-Braunschweig
Jordan, W.; OSRAM GmbH, Augsburg, GERMANY
Revtova, E.; VSL, Dutch Metrology Institute, Delft, THE NETHERLANDS
Poikonen, T.; VTT Ltd, Espoo, FINLAND
Renoux, D.; LNE, Trappes, FRANCE
Blattner, P.; METAS, Bern, SWITZERLAND
|
| Quelle/Jahr | 13th International Conference on New Developments and Applications in Optical Radiometry (NEWRAD 2017): Proceedings:(2017), 94 - 95 |
| Availability | [USB-Stick] |
| Verlag | [s.l.]: |
| Konferenzangaben | 13th International Conference on New Developments and Applications in Optical Radiometry, Tokyo, 13-16, June, 2017, Japan |
| Freie Schlagworte | integrating sphere ; tunable LED ; transfer standard ; luminous flux |
| Zusammenfassung | Proper characterisation of test-setups used in industry for testing and traceable measurement of lighting devices by substitution methods is an important task. In many cases the properties of the device under test (DUT) differ from the transfer standard used which may cause significant errors, e.g. if an LED-based lamp is calibrated in an integrating sphere which was calibrated with a halogen lamp. This publication introduces a Multiple Transfer Standard (MTS) which was designed not only to transfer a single calibration value but also to enable the characterization of test setups by means of additional calibrated output features. |
Zitierung
Sperling, A., Meyer, M., Gerloff, T., Jordan, W., Revtova, E., Poikonen, T., Renoux, D., & Blattner, P. (2017). Multiple Transfer Standard for calibration and characterisation of test setups in industry. 13th International Conference on New Developments and Applications in Optical Radiometry, Tokyo, 13-16, June, 2017, Japan.