| Zugriffsnummer | 39293 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | The synthesis and metrology of colloidal semiconductor nanocrystals |
| Autor(in); Institution |
Porsiel, Julian Cedric; 4.2, Bild- und Wellenoptik, PTB-Braunschweig; Technische Universität Braunschweig, Institute for Particle Technology (iPAT), Braunschweig, GERMANY; Laboratory of Emerging Nanometrology (LENA), Braunschweig, GERMANY
Schirmacher, Alfred; 4.2, Bild- und Wellenoptik, PTB-Braunschweig; Laboratory of Emerging Nanometrology (LENA), Braunschweig, GERMANY
Buhr, Egbert; 4.2, Bild- und Wellenoptik, PTB-Braunschweig; Laboratory of Emerging Nanometrology (LENA), Braunschweig, GERMANY
Garnweitner, Georg; Universität Braunschweig, Institute for Particle Technology (iPAT), Braunschweig, GERMANY; Laboratory of Emerging Nanometrology (LENA), Braunschweig, GERMANY
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| Quelle/Jahr | Proceedings of the 17th International Conference of the European Society for Precision Engineering and Nanotechnology:(2017), 359 - 360 |
| Herausgeber(in) |
Billington, D.
|
| ISBN | 978-0-9957751-0-7 |
| Verlag | Bedford: Euspen |
| Konferenzangaben | Euspen, Hannover, 29, May - 02, June, 2017, Germany |
| Freie Schlagworte | Semiconductor nanocrystals ; synthesis ; metrology ; UV-spectroscopy ; SAXS ; TEM ; CdSe ; correlation models |
| Zusammenfassung | Due to their unique electronic and optical properties, as well as their promising application in many modern technologies, the demand for semiconductor nanocrystals has rapidly increased over the past few years. While the synthesis of monodisperse nanoparticles is easily possible via various methods, each sample still has to be characterized and validated for its use. To assess all features like size, concentration, polydispersity and morphology, most commonly UV-spectroscopy and transmission electron microscopy (TEM) are combined. TEM is known to be a less accessible and strongly time consuming method. As a possible faster but, in terms of accuracy, equal alternative we explored small angle x-ray scattering (SAXS) as a metrological precision tool. SAXS measures the ensemble and gives great evidence towards particle interaction while enabling a direct measurement of dispersions, not requiring a precise sample preparation prior to the measurement, and not being restricted to a local focus. In the beginning the main focus of this study was laid on the development of correlating models between these methods and the complete metrology of any given sample. First measurements were done on the well-known cadmium selenide (CdSe) system. The synthesis of monodisperse semiconductor nanoparticles, including an investigation of different synthesis approaches, ligands/shells or solvents, built the base of the routine within this work. Therefore, the synthesis parameters have been analysed towards their influence on the system within each method. The correlation of the collected data to the most accessible features (size and absorption) is in great accordance with the literature. The processing of further experimental data will yield a comprehensive model function fully characterizing a monomorphic sample. Until methods have been developed to distinguish between individual characteristics within the absorbance spectra of a polymorphic sample, SAXS is able to support the identification of each fraction and a thorough metrological analysis. |
