Zugriffsnummer 39124
Dokumenttyp Zeitschriftenartikel
Sprache Englisch
Titel Angle-resolved x-ray spectroscopic scheme to determine overlapping hyperfine splittings in highly charged heliumlike ions
Autor(in); Institution
Wu, Zhongwen; Helmholtz-Institut, Jena, GERMANY
Volotka, Andrey; Helmholtz-Institut, Jena, GERMANY
Surzhykov, Andrey; FPM, Fundamentale Physik für Metrologie, PTB-Braunschweig
Fritzsche, Stephan; Helmholtz-Institut, Jena, GERMANY
Quelle/Jahr Physical Review A: 96 (2017), 1, 012503-1 - 012503-5
ISSN 2469-9926 (PRINT) ; 2469-9934 (ONLINE)
DOI
Verlag Melville, NY: AIP
Freie Schlagworte Hyperfine splitting ; x-ray spectrometry ; angular distribution ; highly charged ions
Zusammenfassung An angle-resolved x-ray spectroscopic scheme is presented for determining the hyperfine splitting of highly charged ions. For heliumlike ions, in particular, we propose to measure either the angular distribution or polarization of the 1s2p3P1,F → 1s21S0,Ff emission following the stimulated decay of the initial 1s2s1S0,-Fi level. It is found that both the angular and polarization characteristics of the emitted x-ray photons strongly depend on the (relative) splitting of the partially overlapping hyperfine 1s2p3P1,F resonances and may thus help resolve their hyperfine structure. The proposed scheme is feasible with present-day photon detectors and allows a measurement of the hyperfine splitting of heliumlike ions with a relative accuracy of about 10−4.

Zitierung

Wu, Z., Volotka, A., Surzhykov, A., & Fritzsche, S. (2017). Angle-resolved x-ray spectroscopic scheme to determine overlapping hyperfine splittings in highly charged heliumlike ions. Physical Review A, 96(1), 012503-1–012503-5. https://doi.org/10.1103/physreva.96.012503

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