| Zugriffsnummer | 39013 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Surface analysis by XRF and XPS for the Avogadro constant and the realization of the kilogram based on silicon spheres |
| Autor(in); Institution |
Beyer, Edyta; 1.8, Masse - Darstellung der Einheit, PTB-Braunschweig
Kolbe, Michael; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Müller, Matthias; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Darlatt, Erik; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
|
| Quelle/Jahr | Proceedings of VII International Competition of COOMET BEST YOUNG METROLOGIST. Ukrainskij Metrologicnij Zurnal:(2017), 1A, 34 - 36 |
| ISSN | 2306-7039 (PRINT) ; 2522-1345 (ONLINE) |
| DOI | |
| Verlag | Charkiv: |
| Konferenzangaben | VII International Competition of COOMET "BEST YOUNG METROLOGIST", Astana, 17-18, May, 2017, Kazakhstan |
| Freie Schlagworte | Measurement techniques ; surface analysis ; Avogadro constant ; mass realization |
| Zusammenfassung | The determination of the Avogadro constant for the redefinition of the SI unit kilogram as well as the eventual realization of the kilogram by monocrystalline enriched 28Si-spheres require a reliable surface analysis on silicon spheres. A novel instrumentation for the quantitative surface analysis of silicon spheres combines X-ray fluorescence spectroscopy and X-ray photoelectron spectroscopy techniques in order to enable the characterization and quantification of the oxide layer and inintentional contaminations. The analysis relies on the combination of the complementary X-ray methods. Measurements on 28Si-spheres were carried out. The surface was characterized regarding the elementary composition including the chemical binding states of the components and the mass of the surface layer |
| Kostenfreier Zugang | Freier Zugang |