| Zugriffsnummer | 38876 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Optical and RF metrology for 5G |
| Autor(in); Institution |
Humphreys, David A.; National Physical Laboratory (NPL), Teddington, UK
Fatadin, Irshaad; National Physical Laboratory (NPL), Teddington, UK
Bieler, Mark; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Struszewski, Paul; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Hudlicka, Martin; Czech Metrology Institute (CMI), Brno, CZECH REPUBLIC
|
| Quelle/Jahr | 2017 IEEE Photonics Society Summer Topical Meeting Series (SUM):(2017), 195 - 196 |
| ISBN | 978-1-5090-6571-4 ; 978-1-5090-6570-7 ; 978-1-5090-6572-1 |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | 2017 IEEE Photonics Society Summer Topical Meeting Series, San Juan, 10-12, July, 2017, Puerto Rico |
| Freie Schlagworte | 5G ; photodiodes ; digital real-time oscilloscope ; error vector magnitude |
| Zusammenfassung | Specification standards will soon be available for 5G mobile RF communications. What optical and electrical metrology is needed or available to support the development of the supporting optical communication systems? Device measurement, digital oscilloscope impairments and improving system resolution are discussed. |
