| Zugriffsnummer | 38141 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Measurement of the complex permittivity of microwave materials with a submillimeter four-port reflectometer |
| Autor(in); Institution |
Stumper, Ulrich; 2.22, Hochfrequenznormale, PTB-Braunschweig
|
| Quelle/Jahr | CPEM'88 digest, 1988 Conference on Precision Electromagnetic Measurements:(1988), 141 - 142 |
| Herausgeber(in) |
Suematsu, Yasuharu
|
| Verlag | New York, NY: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements (CPEM) 1988, Tsukuba, 07-10, June, 1988, Japan |
| Zusammenfassung | A new four-port reflectometer for the determination of the complex relative permittivity of microwave materials at submillimeter wavelength is described. Measurement results obtained with various low-loss solids at frequencies of about 380 GHz agree well with data taken from the literature or obtained as results of an international comparison measurement exercise. |
