| Zugriffsnummer | 38014 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | Characterizing superconducting filters using residual microwave background |
| Autor(in); Institution |
Lehtinen, Janne S.; VTT Technical Research Centre of Finland, Centre for Metrology MIKES, Espoo, FINLAND
Mykkänen, Emma; VTT Technical Research Centre of Finland, Centre for Metrology MIKES, Espoo, FINLAND
Kemppinen, Antti; VTT Technical Research Centre of Finland, Centre for Metrology MIKES, Espoo, FINLAND
Lotkhov, Sergey V.; 2.4, Quantenelektronik, PTB-Braunschweig
Golubev, Dmitri; Aalto University, Department of Applied Physics, Aalto, FINLAND
Manninen, Antti J.; VTT Technical Research Centre of Finland, Centre for Metrology MIKES, Espoo, FINLAND
|
| Quelle/Jahr | Superconductor Science and Technology: 30 (2017), 5, 055006-1 - 055006-10 |
| ISSN | 0953-2048 (PRINT) ; 1361-6668 (ONLINE) |
| DOI | |
| Verlag | Bristol: IOP Publ. |
| Freie Schlagworte | superconductivity ; microwave propagation ; single-electron trap ; microwave photon detection ; on-chip filters ; Josephson array |
| Zusammenfassung | A normal metal-superconductor hybrid single-electron trap with tunable barrier is utilized as a tool for spectrum analysis at the extremely low signal levels, using only well filtered cryogenic microwave background as a photon source in the frequency range from about 50 to 210 GHz. We probe millimeter wave propagation in two superconducting systems: a Josephson junction array around its plasma frequency, and a superconducting titanium film in the limit when the photon energies are larger than the superconducting energy gap. This regime is relevant for improving the performance of cryogenic quantum devices but is hard to access with conventional techniques. We show that relatively simple models can be used to describe the essential properties of the studied components. |
Zitierung
Lehtinen, J. S., Mykkänen, E., Kemppinen, A., Lotkhov, S. V., Golubev, D., & Manninen, A. J. (2017). Characterizing superconducting filters using residual microwave background. Superconductor Science and Technology, 30(5), 055006-1–055006-10. https://doi.org/10.1088/1361-6668/aa63bc