| Zugriffsnummer | 37556 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | Traceable size and size distribution calibrations of nanoparticles |
| Autor(in); Institution |
Buhr, Egbert; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Dziomba, Thorsten; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Frase, Carl Georg; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Krumrey, Michael; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Bosse, Harald; 5, Fertigungsmesstechnik, PTB-Braunschweig
|
| Quelle/Jahr | Chemie-Ingenieur-Technik: 89 (2017), 3, 239 - 243 |
| ISSN | 0009-286X (PRINT) ; 1522-2640 (ONLINE) |
| DOI | |
| Verlag | Weinheim: Wiley-VCH |
| Freie Schlagworte | Nanoparticles ; Scanning electron microscopy ; Scanning probe microscopy ; X-ray scattering ; Size calibration |
| Zusammenfassung | Quality control of nanoparticle production processes requires traceable calibration methods for size and size distribution which are presented and discussed in this article. The main focus is on the one hand the application of small-angle X-ray scattering for an integral measurement of nanoparticles in liquid suspension and on the other hand scanning electron microscopy in transmission for a microscopic measurement method of nanoparticles prepared on a substrate. In addition, characterization by scanning probe microscopy is covered. |
