Zugriffsnummer 37375
Dokumenttyp Zeitschriftenartikel
Sprache Englisch
Titel Nonlinearity of a double-path interferometer qualified with a non-constant moving speed
Autor(in); Institution
Hongxing, Yang; Harbin Institute of Technology, Institute of Ultra-Precision Optoelectronic Instrument Engineering, Harbin, CHINA
Weichert, Christoph; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Köchert, Paul; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Flügge, Jens; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Quelle/Jahr Optics Letters: 41 (2016), 23, 5478 - 5481
ISSN 0146-9592 (PRINT) ; 1539-4794 (ONLINE)
DOI
Verlag Washington, DC: Optical Society of America
Klassifikationscode OCIS: 120.3180 ; OCIS: 120.4640 ; OCIS: 130.0130 ; OCIS: 140.0140
Freie Schlagworte optical metrology ; nonlinearity ; double-pass interferometer
Zusammenfassung A new double-path heterodyne interferometer with spatially separated input beams was developed to minimize the influence of periodic errors. The optics of measuring and reference interferometers are balanced by optimizing optical components, which means phase offsets caused by the optical path differences, and thermal influence on the optics are reduced. Furthermore, due to the usage of corner cube reflectors, the interferometer is capable to tolerate angular motions of the measuring mirror. The nonlinearities were characterized in a measurement with non-constant moving speed by means of amplitude spectra for spline-interpolated data. Experimental results indicated that the amplitude of the periodic error was kept within 0.63 nm and was caused by multi-reflections.

Zitierung

Hongxing, Y., Weichert, C., Köchert, P., & Flügge, J. (2016). Nonlinearity of a double-path interferometer qualified with a non-constant moving speed. Optics Letters, 41(23), 5478–5481. https://doi.org/10.1364/ol.41.005478

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