Zugriffsnummer 37258
Dokumenttyp Konferenzartikel
Peer Review unbekannt
Sprache Englisch
Titel Verification concepts in S-parameter measurements
Autor(in); Institution
Mubarak, F.; VSL, Van Swinden Laboratorium, Delft, THE NETHERLANDS
Zeier, M.; Federal Institute of Metrology METAS, Bern-Wabern, SWITZERLAND
Hoffmann, J.; Federal Institute of Metrology METAS, Bern-Wabern, SWITZERLAND
Ridler, N. M.; NPL, National Physical Laboratory, Teddington, UK
Salter, M. J.; NPL, National Physical Laboratory, Teddington, UK
Kuhlmann, Karsten; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Quelle/Jahr CPEM 2016, Conference on Precision Electromagnetic Measurements: conference digest:(2016), 2 S.
Availability [USB-Stick] ; file name: 059.pdf
ISBN 978-1-4673-9134-4 ; 978-1-4673-9133-7
DOI
Verlag [s.l.]: IEEE
Konferenzangaben Conference on Precision Electromagnetic Measurements (CPEM) 2016, Ottawa, 10-15, July, 2016, Canada
Freie Schlagworte Verification ; scattering parameter ; vector network analyzer
Zusammenfassung Verification is an important step in scattering parameter (S-parameter) measurements to ensure the validity of the calibration of a vector network analyzer. This paper discusses specific aspects of vector network analyzer verification concepts that have been established recently as part of a European metrology research project.

Zitierung

Mubarak, F., Zeier, M., Hoffmann, J., Ridler, N. M., Salter, M. J., & Kuhlmann, K. (2016). Verification concepts in S-parameter measurements. Conference on Precision Electromagnetic Measurements (CPEM) 2016, Ottawa, 10-15, July, 2016, Canada. https://doi.org/10.1109/cpem.2016.7540508

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