| Zugriffsnummer | 37194 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Sprache | Englisch |
| Titel | Advances in large-scale metrology - review and future trends |
| Autor(in); Institution |
Schmitt, Robert H.; Laboratory for Machine Tools and Production Engineering (WZL) of RWTH Aachen University, Aachen, GERMANY
Peterek, Martin; Laboratory for Machine Tools and Production Engineering (WZL) of RWTH Aachen University, Aachen, GERMANY
Morse, E.; University of North Carolina in Charlotte (UNCC), University City Blvd, Charlotte, USA
Knapp, Wolfgang; IWF, ETH Zürich, Schleitheim, SWITZERLAND
Galetto, M.; Politecnico di Torino, Torino, ITALY
Härtig, Frank; 1, Mechanik und Akustik, PTB-Braunschweig
Goch, Gert; University of North Carolina in Charlotte (UNCC), University City Blvd, Charlotte, USA
Hughes, Ben; National Physical Laboratory (NPL), Teddington, UK
Forbes, Alistair; National Physical Laboratory (NPL), Teddington, UK
Estler, W. Tyler; National Institute of Standards and Technology (NIST), Gaithersburg, USA
|
| Quelle/Jahr | CIRP Annals: 65 (2016), 2, 643 - 665 |
| ISSN | 0007-8506 |
| DOI | |
| Verlag | Amsterdam: Elsevier |
| Konferenzangaben | 66th General Assembly of CIRP, Guimaraes, 21-27, August, 2016, Portugal |
| Freie Schlagworte | Metrology ; Modeling ; Large-Scale Metrology |
| Zusammenfassung | The field of large scale metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy and laboratory calibration. A primary reason that large scale metrology continues to represent the research frontier is that technological advances introduced and perfected at a conventional scale face additional challenges which increase non-linearly with size. This necessitates new ways of considering the entire measuring process, resulting in the application of concepts such as virtual measuring processes and cyber-physical systems. This paper reports on the continuing evolution of large scale metrology. |
Zitierung
Schmitt, R. H., Peterek, M., Morse, E., Knapp, W., Galetto, M., Härtig, F., Goch, G., Hughes, B., Forbes, A., & Estler, W. T. (2016). Advances in large-scale metrology - review and future trends. CIRP Annals, 65(2), 643–665. https://doi.org/10.1016/j.cirp.2016.05.002