| Zugriffsnummer | 36697 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Robustness of single-electron pumps at sub-ppm level |
| Autor(in); Institution |
Stein, Friederike; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Behr, Ralf; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Götz, Martin; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Pesel, Eckart; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Weimann, Thomas; 2.4, Quantenelektronik, PTB-Braunschweig
Pierz, Klaus; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Schumacher, Hans Werner; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Hohls, Frank; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
|
| Quelle/Jahr | CPEM 2016, Conference on Precision Electromagnetic Measurements: conference digest:(2016), 2 S. |
| Availability | [USB-Stick] ; file name: 174.pdf |
| ISBN | 978-1-4673-9134-4 ; 978-1-4673-9133-7 |
| DOI | |
| Verlag | [s.l.]: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements (CPEM) 2016, Ottawa, 10-15, July, 2016, Canada |
| Freie Schlagworte | Current measurement ; quantized current ; redefinition of SI base units ; single-electron pump |
| Zusammenfassung | Single-electron pumps (SEP's) based on tunable barrier quantum dots show the most promise as high-precision nanoampere quantum sources. They are treated as a good candidate in the context of a quantum representation of the SI base unit ampere. A key point for such a realization is the robustness of operation. Here we show the invariance of current at a sub-ppm level against variation of magnetic flux density, bias voltage on source and drain and the entrance gate voltage. |
Zitierung
Stein, F., Behr, R., Götz, M., Pesel, E., Weimann, T., Pierz, K., Schumacher, H. W., & Hohls, F. (2016). Robustness of single-electron pumps at sub-ppm level. Conference on Precision Electromagnetic Measurements (CPEM) 2016, Ottawa, 10-15, July, 2016, Canada. https://doi.org/10.1109/cpem.2016.7540622