| Zugriffsnummer | 36669 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Towards a quantum sampling system |
| Autor(in); Institution |
Iuzzolino, Ricardo; Instituto Nacional de Tecnología Industrial (INTI), Buenos Aires, ARGENTINA
Behr, Ralf; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Bierzychudek, Marcos; Instituto Nacional de Tecnología Industrial (INTI), Buenos Aires, ARGENTINA
Palafox Gamir, Luis; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
|
| Quelle/Jahr | CPEM 2016, Conference on Precision Electromagnetic Measurements: conference digest:(2016), 2 S. |
| Availability | [USB-Stick] ; file name: 300.pdf |
| ISBN | 978-1-4673-9134-4 ; 978-1-4673-9133-7 |
| DOI | |
| Verlag | IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements (CPEM) 2016, Ottawa, 10-15, July, 2016, Canada |
| Freie Schlagworte | Voltage measurement ; Josephson effect ; Measurement standards ; Analog-digital conversion ; Metrology |
| Zusammenfassung | This summary paper describes the development of a system based on the Josephson effect, to calibrate and characterize voltage standards and digital sampling systems. In particular, this work includes the test of a digital-to-analog converter as a source to bias the segments of the programmable Josephson array. |
