| Zugriffsnummer | 36633 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Reflection measurement of low-reflective loads at millimeter waves |
| Autor(in); Institution |
Stumper, Ulrich; PTB-Braunschweig, retired staff
Schrader, Thorsten; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Judaschke, Rolf; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
|
| Quelle/Jahr | IEEE Transactions on Instrumentation and Measurement: 65 (2016), 9, 2129 - 2136 |
| ISSN | 0018-9456 |
| DOI | |
| Verlag | New York: IEEE |
| Freie Schlagworte | sensitivity coefficients ; Complex reflection coefficient ; cross-ratio invariance ; impedance standards ; microwave measurements ; microwave reflectometer |
| Zusammenfassung | The well-known cross-ratio method of correction of the complex reflection coefficient of low-reflective waveguide one-port devices, which is well established up to 110 GHz, is extended to millimeter wave frequencies where the impedance standard, a quarter-wavelength rectangular waveguide section at midband, may become too thin to be fabricated and handled. Therefore, an alternative extended cross-ratio correction method (ECM) is presented where a pair of longer waveguide sections having well-defined cross-sectional dimensions and lengths is used instead. Their difference in length is a quarter-wavelength at midband. The method is tested in the WR-5 waveguide band (frequency f = 140 GHz-220 GHz), where a quarter-wave line is still thick enough to handle. The measurement results obtained by the ECM using two lines agree well with the results from the single-line cross-ratio method as well as with measurements obtained from a line-reflect-line calibration. Sensitivity coefficients are derived, which indicate how the measuring result is influenced by deviations of the different input parameters that are necessary to calculate the reflection coefficient. |
