| Zugriffsnummer | 36417 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Experimental determination of the effective attenuation length of palladium 3d 5/2 photoelectrons in a magnetron sputtered Pd nanolayer |
| Autor(in); Institution |
Dietrich, Paul M.; Bundesanstalt für Materialforschung und –prüfung, (BAM), Berlin, GERMANY
Treu, Dieter; Bundesanstalt für Materialforschung und –prüfung, (BAM), Berlin, GERMANY
Kalbe, H.; Bundesanstalt für Materialforschung und –prüfung, (BAM), Berlin, GERMANY
Krumrey, Michael; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Gross, Thomas; Bundesanstalt für Materialforschung und –prüfung, (BAM), Berlin, GERMANY
Marti, Kilian; METAS – Federal Institute of Metrology, Ber, SWITZERLAND
Unger, Wolfgang; Bundesanstalt für Materialforschung und –prüfung, (BAM), Berlin, GERMANY
|
| Quelle/Jahr | Surface and Interface Analysis: 49 (2017), 5, 464 - 468 |
| ISSN | 0142-2421 (PRINT) ; 1096-9918 (ONLINE) |
| DOI | |
| Verlag | Chichester [u.a.]: Wiley-VCH |
| Zusammenfassung | The electron effective attenuation length (EAL) for Al Kα excited Pd 3d 5/2 photoelectrons has been determined experimentally in a magnetron sputtered Pd nano scaled film on a flat fused quartzsubstrate. The experimental results are compared to data generated by using the TPP formula and the SESSA software revealing good agreement. Contributions to the uncertainty budget related to the experimental approach are discussed in detail. Proposals on how to further improve the approach are developed in the conclusions paragraph. |
Zitierung
Dietrich, P. M., Treu, D., Kalbe, H., Krumrey, M., Gross, T., Marti, K., & Unger, W. (2017). Experimental determination of the effective attenuation length of palladium 3d 5/2 photoelectrons in a magnetron sputtered Pd nanolayer. Surface and Interface Analysis, 49(5), 464–468. https://doi.org/10.1002/sia.6141