| Zugriffsnummer | 36313 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods |
| Autor(in); Institution |
Bieler, Mark; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Arz, Uwe; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
|
| Quelle/Jahr | 2016 IEEE 20th Workshop on Signal and Power Integrity (SPI): proceedings:(2016), 1 - 4 |
| ISBN | 978-1-5090-0349-5 ; 978-1-5090-0348-8 |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | 2016 IEEE 20th Workshop on Signal and Power Integrity (SPI), Turin, 08-11, May, 2016, Italy |
| Zusammenfassung | A high-frequency interconnect consisting of coplanar and coaxial elements is characterized using time- and frequency domain methods. As frequency-domain technique we employ conventional vector network analysis, while as time-domain technique a recently developed laser-based vector network analyzer is used. For the first time, both methods are compared in the frequency range from 10 GHz to 110 GHz. We obtain good agreement in almost the entire frequency range. Our results pave the way towards mutual independent verification of time- and frequency-domain high-frequency measurement techniques. |
Zitierung
Bieler, M. & Arz, U. (2016). Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods. 2016 IEEE 20th Workshop on Signal and Power Integrity (SPI), Turin, 08-11, May, 2016, Italy. https://doi.org/10.1109/sapiw.2016.7496271