Zugriffsnummer 35920
Dokumenttyp Zeitschriftenartikel
Peer Review unbekannt
Sprache Englisch
Titel Dynamic high-resolution spectroscopic frequency referencing for frequency sweeping interferometry
Autor(in); Institution
Prellinger, Günther; 5.4, Interferometrie an Maßverkörperungen, PTB-Braunschweig
Meiners-Hagen, Karl; 5.4, Interferometrie an Maßverkörperungen, PTB-Braunschweig
Pollinger, Florian; 5.4, Interferometrie an Maßverkörperungen, PTB-Braunschweig
Quelle/Jahr Surface Topography: Metrology and Properties: 4 (2016), 2, 1 - 10
Artikelnummer 024012
Availability [online only]
ISSN 2051-672X
DOI
Verlag Bristol: IOP
Freie Schlagworte Frequency-sweeping interferometry ; Doppler-free spectroscopy ; frequency reference ; length metrology
Zusammenfassung A spectroscopic reference for the intrinsic frequency calibration of a ranging system based on frequency-sweeping interferometry (FSI) is presented. Saturation spectroscopy of iodine transitions at 636.8 nm is used to generate well-defined frequency markers. The experimental and analytic implementation is shown to enable in principle a frequency determination with an uncertainty of 0.17 MHz for a coverage factor k = 1. This corresponds to a relative standard uncertainty of 1.5 × 10 E-7 as contribution to the combined measurement uncertainty of the FSI-based length measurement. But the analysis also reveals the high sensitivity of the actually achievable measurement uncertainty to the quality of the spectroscopic reference data.

Zitierung

Prellinger, G., Meiners-Hagen, K., & Pollinger, F. (2016). Dynamic high-resolution spectroscopic frequency referencing for frequency sweeping interferometry. Surface Topography: Metrology and Properties, 4(2), 1–10. https://doi.org/10.1088/2051-672x/4/2/024012

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