| Zugriffsnummer | 35672 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Surface characterization of silicon spheres by combined XRF and XPS analysis for determination of the avogadro constant |
| Autor(in); Institution |
Fliegauf, Rolf; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Beckhoff, Burkhard; 7.2, Kryophysik und Spektrometrie, PTB-Berlin
Beyer, Edyta; 1.8, Masse - Darstellung der Einheit, PTB-Braunschweig
Darlatt, Erik; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Holfelder, Ina; 7.2, Kryophysik und Spektrometrie, PTB-Berlin
Hönicke, Philipp; 7.2, Kryophysik und Spektrometrie, PTB-Berlin
Ulm, Gerhard; 7, Temperatur und Synchrotronstrahlung, PTB-Berlin
Kolbe, Michael; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
|
| Quelle/Jahr | CPEM 2016, Conference on Precision Electromagnetic Measurements: conference digest:(2016), 2 S. |
| Availability | [USB-Stick] ; file name: 351.pdf, |
| ISSN | 2160-0171 (ONLINE) |
| ISBN | 978-1-4673-9134-4 ; 978-1-4673-9133-7 |
| DOI | |
| Verlag | New York, NY: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements (CPEM) 2016, Ottawa, 10-15 July, 2016, Canada |
| Freie Schlagworte | measurement techniques ; precision measurements ; fundamental constants ; avogadro constant |
| Zusammenfassung | For the quantitative surface characterization of a monocrystalline silicon sphere PTB has constructed and taken into operation an analytical instrumentation, which combines X-ray fluorescence and X-ray photoelectron spectroscopy techniques. The main objective of this novel instrumentation is the characterization of the oxide layer and unintentional contaminations, e.g. from hydrocarbons. It is equipped with a ball manipulator allowing to measure at each point on the surface of ball-shaped sample with a diameter of about 93.6 mm. Monocrystalline silicon spheres with this diameter allow a realization of the SI-base unit of the mass. |
Zitierung
Fliegauf, R., Beckhoff, B., Beyer, E., Darlatt, E., Holfelder, I., Hönicke, P., Ulm, G., & Kolbe, M. (2016). Surface characterization of silicon spheres by combined XRF and XPS analysis for determination of the avogadro constant. Conference on Precision Electromagnetic Measurements (CPEM) 2016, Ottawa, 10-15 July, 2016, Canada. https://doi.org/10.1109/cpem.2016.7540797