Zugriffsnummer 35440
Dokumenttyp Zeitschriftenartikel Open Access Gold
Peer Review mit Peer Review
Sprache Englisch
Titel Evaluation of absolute form measurements using a tilted-wave interferometer
Autor(in); Institution
Fortmeier, Ines; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Stavridis, Manuel; 8.4, Mathematische Modellierung und Datenanalyse, PTB-Berlin
Wiegmann, Axel; 4.2, Bild- und Wellenoptik, PTB-Braunschweig; Mahr GmbH, Jena, GERMANY
Schulz, Michael; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Osten, Wolfgang; University of Stuttgart, Institute of Applied Optics, Stuttgart, GERMANY
Elster, Clemens; 8.4, Mathematische Modellierung und Datenanalyse, PTB-Berlin
Quelle/Jahr Optics Express: 24 (2016), 4, 3393 - 3404
Availability [online only]
ISSN 1094-4087 (ONLINE)
DOI
Verlag Washington, DC: OSA
Klassifikationscode OCIS: 120.3940 ; OCIS: 120.3180 ; OCIS: 120.6650 ; OCIS: 220.1250
Freie Schlagworte Metrology ; Interferometry ; Surface measurements ; figure ; Aspherics
Zusammenfassung Tilted-wave  interferometry  is  a  promising  measurement technique  for  the  highly  accurate  measurement  of  aspheres  and  freeform surfaces. However, the interferometric fringe evaluation of the sub-apertures causes  unknown  patch  offsets,  which  currently  prevent  this  measurement technique from providing absolute measurements. Simple strategies, such as  constructing  differences  of  optical  path  length  differences  (OPDs)  or ignoring the piston parameter, can diminish the accuracy resulting from the absolute form measurement. Additional  information is needed instead; in this paper, the required accuracy of such information is explored in virtual experiments. Our simulation study reveals that, when one absolute OPD is known  within  a  range  of  500  nm,  the  accuracy  of  the  final  measurement result is significantly enhanced.
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Zitierung

Fortmeier, I., Stavridis, M., Wiegmann, A., Schulz, M., Osten, W., & Elster, C. (2016). Evaluation of absolute form measurements using a tilted-wave interferometer. Optics Express, 24(4), 3393–3404. https://doi.org/10.1364/oe.24.003393

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