Zugriffsnummer 35384
Dokumenttyp Zeitschriftenartikel
Peer Review unbekannt
Sprache Englisch
Titel Markov Chain Monte Carlo methods: an introductory example
Autor(in); Institution
Klauenberg, Katy; 8.4, Mathematische Modellierung und Datenanalyse, PTB-Berlin
Elster, Clemens; 8.4, Mathematische Modellierung und Datenanalyse, PTB-Berlin
Quelle/Jahr Metrologia: 53 (2016), 1, S32 - S39
ISSN 0026-1394 (PRINT) ; 1681-7575 (ONLINE)
DOI
Verlag Bristol: IOP Publishing
Freie Schlagworte MCMC ; Metropolis–Hastings ; Monte Carlo ; Bayesian statistics ; high-dimensional integration ; proposal distribution ; convergence diagnostics
Zusammenfassung When the Guide to the Expression of Uncertainty in Measurement (GUM) and methods from its supplements are not applicable, the Bayesian approach may be a valid and welcome alternative. Evaluating the posterior distribution, estimates or uncertainties involved in Bayesian inferences often requires numerical methods to avoid high-dimensional integrations. Markov chain Monte Carlo (MCMC) sampling is such a method—powerful, flexible and widely applied. Here, a concise introduction is given, illustrated by a simple, typical example from metrology. The Metropolis–Hastings algorithm is the most basic and yet flexible MCMC method. Its underlying concepts are explained and the algorithm is given step by step. The few lines of software code required for its implementation invite interested readers to get started. Diagnostics to evaluate the performance and common algorithmic choices are illustrated to calibrate the Metropolis–Hastings algorithm for efficiency. Routine application of MCMC algorithms may be hindered currently by the difficulty to assess the convergence of MCMC output and thus to assure the validity of results. An example points to the importance of convergence and initiates discussion about advantages as well as areas of research. Available software tools are mentioned throughout.

Zitierung

Klauenberg, K. & Elster, C. (2016). Markov Chain Monte Carlo methods: an introductory example. Metrologia, 53(1), S32–S39. https://doi.org/10.1088/0026-1394/53/1/s32

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