| Zugriffsnummer | 35258 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Reinhold Klockenkämper and Alex von Bohlen: Total-reflection X-ray fluorescence analysis and related methods methods, 2nd ed. [Rezension] |
| Autor(in); Institution |
Beckhoff, Burkhard; 7.2, Kryophysik und Spektrometrie, PTB-Berlin
|
| Quelle/Jahr | Analytical and Bioanalytical Chemistry: 408 (2016), 3, 667 - 669 |
| ISSN | 1618-2642 (PRINT) ; 1618-2650 (ONLINE) |
| DOI | |
| Verlag | Berlin [u.a.]: Springer |
| Zusammenfassung | Book’s topic X-rays can excite the atoms of the sample constituents inducing the emission of fluorescence radiation that is characteristic for the individual elements. By recording and evaluating the fluorescence radiation intensity quantitatively, X-Ray Fluorescence (XRF) analysis allows for the determination of the number of atoms of each excited element per area, which can be transferred to elemental mass depositions (mass per area), layer thicknesses (involving density information) or elemental weight concentrations in layers or bulk samples. At very shallow angles of incidence of the exciting x-rays with respect to a flat specimen surface, external total reflection of the incident radiation occurs and drastically reduces the penetration depths of the incident radiation into the specimen bulk, thus enhancing the surface sensitivity by decreased substrate fluorescence and scattered excitation radiation intensities. During the last decades this Total-reflection XRF method, or TXRF, became one of the most powerful and cost competitive techniques for surface chemical and trace element analyses. Tuning the angle of incidence across the critical angle of total external reflection, the composition of thin layered systems of low surface and interface roughness can be probed by means of the induced X-ray Standing Wave (XSW) field. The dimensions of the XSW field intensity are employed as a nanoscaled sensor in this Grazing-Incidence XRF, or GI-XRF, technique. TXRF and GI-XRF have successfully demonstrated their analytical capabilities in various modern applications to bio- and nanotechnologies involving minute sample amounts, nanoparticles and nanostructures on or below surfaces. The second edition of the book ‘Total-Reflection X-Ray Fluorescence Analysis and Related Methods’ was written by Reinhold Klockenkämper and Alex von Bohlen, both from the German Leibniz-Institut für Analytische Wissenschaften (ISAS), which promotes research in the analytical sciences. Readers of the first edition by R. Klockenkämper (1997) will be pleased to discover that the new edition also includes a wide variety of recent developments in TXRF and GI-XRF methodology, instrumentation, and modern fields of application. |
