| Zugriffsnummer | 35015 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Polarization sensitivity testing of off-plane reflection gratings |
| Autor(in); Institution |
Marlowe, Hannah; University of Iowa, Department of Physics & Astronomy, Iowa City IA, USA
McEntaffer, Randall L.; University of Iowa, Department of Physics & Astronomy, Iowa City IA, USA
DeRoo, Casy T.; University of Iowa, Department of Physics & Astronomy, Iowa City IA, USA
Miles, Drew M.; University of Iowa, Department of Physics & Astronomy, Iowa City IA, USA
Tutt, James H.; Max Planck Institute for extraterrestrische Physik PANTER, Garching, GERMANY
Laubis, Christian; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Soltwisch, Victor; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
|
| Quelle/Jahr | SPIE Optics for EUV, X-Ray, and Gramma-Ray Astronomy VII:(2015), 960318-1 - 960318-7 |
| Schriftenreihe | Proceedings of SPIE: 9603 |
| Herausgeber(in) |
O'Dell, Stephen L.
Pareschi, Giovanni
|
| ISSN | 0277-786X |
| ISBN | 978-1-62841-769-2 |
| DOI | |
| Verlag | Bellingham, Wash.: SPIE |
| Konferenzangaben | SPIE Optics for EUV, X-Ray, and Gramma-Ray Astronomy VII, San Diego, CA, 9-13 August, 2015, USA |
| Freie Schlagworte | diffraction ; gratings ; grazing incidence ; X-rays ; polarimetry |
| Zusammenfassung | Off-Plane reflection gratings were previously predicted to have different efficiencies when the incident light is polarized in the transverse-magnetic (TM) versus transverse-electric (TE) orientations with respect to the grating grooves. However, more recent theoretical calculations which rigorously account for finitely conducting, rather than perfectly conducting, grating materials no longer predict significant polarization sensitivity. We present the first empirical results for radially ruled, laminar groove profile gratings in the off-plane mount which demonstrate no difference in TM versus TE efficiency across our entire 300–1500 eV bandpass. These measurements together with the recent theoretical results confirm that grazing incidence off-plane reflection gratings using real, not perfectly conducting, materials are not polarization sensitive. |
Zitierung
Marlowe, H., McEntaffer, R. L., DeRoo, C. T., Miles, D. M., Tutt, J. H., Laubis, C., & Soltwisch, V. (2015). Polarization sensitivity testing of off-plane reflection gratings. SPIE Optics for EUV, X-Ray, and Gramma-Ray Astronomy VII, San Diego, CA, 9-13 August, 2015, USA. https://doi.org/10.1117/12.2186344