| Zugriffsnummer | 34366 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Investigation of verification artifacts in WR-03 waveguides |
| Autor(in); Institution |
Shoaib, Nosherwan; National Institute of Metrological Research (INRiM), Nanoscience and Materials Division, Torino, ITALY
Kuhlmann, Karsten; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Judaschke, Rolf; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Sellone, Marco; National Institute of Metrological Research (INRiM), Nanoscience and Materials Division, Torino, ITALY
Brunetti, Luciano; National Institute of Metrological Research (INRiM), Nanoscience and Materials Division, Torino, ITALY
|
| Quelle/Jahr | Journal of Infrared, Millimeter, and Terahertz Waves: 36 (2015), 11, 1089 - 1100 |
| ISSN | 1866-6892 (PRINT) ; 1866-6906 (ONLINE) |
| DOI | |
| Verlag | New York, NY: Springer |
| Freie Schlagworte | Scattering parameters ; Waveguide standards ; Measurement uncertainty ; Verification artifacts ; Microwave measurements |
| Zusammenfassung | This paper presents an investigation of verification artifacts in WR-03 waveguides. The waveguide verification artifacts include a cross-guide and a custom-made circular iris section. The investigation involves the transmission loss uncertainty analysis of the verification artifacts for vector network analyzer (VNA) waveguide systems operating at millimeter wavelengths. The measurement errors due to the dimensional tolerances and the flange misalignment are predicted by using a commercially available electromagnetic software package. The data analysis is carried out for complex-valued scattering parameters (S-parameters). The uncertainty due to different error sources is computed according to the Law of Propagation of Uncertainty. The real and imaginary data along with the associated uncertainties are converted to magnitude and phase representation via linear propagation of uncertainties. The experimental results are also compared with simulated results. |
