| Zugriffsnummer | 34083 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Characterization of HAPG mosaic crystals using synchrotron radiation |
| Autor(in); Institution |
Gerlach, Martin; 7.2, Kryophysik und Spektrometrie, PTB-Berlin
Anklamm, L.; Technische Universität Berlin, Berlin, GERMANY
Antonov, A.; Optigraph GmbH, Berlin, GERMANY
Grigorieva, I.; Optigraph GmbH, Berlin, GERMANY
Holfelder, Ina; 7.2, Kryophysik und Spektrometrie, PTB-Berlin
Kanngießer, B.; Technische Universität Berlin, Berlin, GERMANY
Legall, H.; Optigraph GmbH, Berlin, GERMANY
Malzer, W.; Technische Universität Berlin, Berlin, GERMANY
Schlesiger, C.; Technische Universität Berlin, Berlin, GERMANY
Beckhoff, Burkhard; 7.2, Kryophysik und Spektrometrie, PTB-Berlin
|
| Quelle/Jahr | Journal of Applied Crystallography: 48 (2015), 5, 1381 - 1390 |
| ISSN | 0021-8898 (PRINT) ; 1600-5767 (ONLINE) |
| DOI | |
| Verlag | Chester, England: Wiley-Blackwell |
| Freie Schlagworte | Pyrolytic Graphite ; HOPG ; HAPG ; mosaic crystal ; synchrotron radiation ; X-ray |
| Zusammenfassung | Highly Annealed Pyrolytic Graphite (HAPG) is a novel type of pyrolytic graphite that, as a mosaic crystal, combines high integral reflectivity with a very low mosaicity of typically less than 0.1°. When used as dispersive X-ray optics, a high resolving power has been observed, Rendering HAPG very suitable for applications in high resolution X-ray spectroscopy, which conventionally relies on ideal crystals. For the design and for modelling of these novel HAPG crystals in high spectral resolving applications, the diffraction properties must be known very accurately. To close this gap, a comprehensive characterization of HAPG crystals was performed that allows for a modelling of the diffraction properties in different diffraction orders over a broad spectral range. The crystal properties under investigation are the mosaic spread, the peak reflectivity and the intrinsic reflection width. The investigations were done for different thick crystal films, which were mounted adhesively on a substrate. It has been shown that the diffraction properties are strongly correlated to the grade of adhesion, which crucially depends on the substrate material and its surface properties. The investigations were performed using monochromatized tunable synchrotron radiation of high spectral purity with a high-precision experimental set-up and calibrated detection devices at the electron storage ring BESSY II. |
Zitierung
Gerlach, M., Anklamm, L., Antonov, A., Grigorieva, I., Holfelder, I., Kanngießer, B., Legall, H., Malzer, W., Schlesiger, C., & Beckhoff, B. (2015). Characterization of HAPG mosaic crystals using synchrotron radiation. Journal of Applied Crystallography, 48(5), 1381–1390. https://doi.org/10.1107/s160057671501287x