Zugriffsnummer 33895
Dokumenttyp Konferenzartikel
Sprache Englisch
Titel In-situ characterisation of nanomechanical measurement instruments using a force transfer standard with interferometric deflection measurement
Autor(in); Institution
Li, Zhi; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
Gao, Sai; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
Brand, Uwe; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
Quelle/Jahr Proceedings of the 15th international conference of the European Society for Precision Engineering and Nanotechnology:(2015), 145 - 146
Herausgeber(in)
Leach, R.
ISBN 978-0-9566790-7-9
Verlag Bedford: Euspen
Konferenzangaben 15th International Conference & Exhibition of the European Society for Precision Engineering & Nanotechnology, Leuven, 01-05, June, 2015, Belgium
Freie Schlagworte micro-force measurement ; interferometric deflection measurement ; nanomechanical instrument
Zusammenfassung To improve the capability of cantilever, beam and membrane-based force transfer standards for in-situ force characterisation with relatively broad measurement range and high resolution, a laser interferometer with sub-nanometer resolution is added to a silicon force transfer standard, whose bending stiffness has been well calibrated. The fast data acquisition system of the laser interferometer enables not only quasi-static force measurement, but also dynamic force characterisation for nanomechanical measurements. The fundamental principle of the proposed system is detailed. A prototype of the closed-loop force standard is realized. In-situ characterisation of the indentation force of a nanoindentation instrument using this prototype is reported in this manuscript.

Zitierung

Li, Z., Gao, S., & Brand, U. (2015). In-situ characterisation of nanomechanical measurement instruments using a force transfer standard with interferometric deflection measurement. 15th International Conference & Exhibition of the European Society for Precision Engineering & Nanotechnology, Leuven, 01-05, June, 2015, Belgium.

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