| Zugriffsnummer | 33703 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Sprache | Englisch |
| Titel | Design and calibration of a compact quasi-optical system for material characterization in millimeter/submillimeter wave domain |
| Autor(in); Institution |
Kazemipour, Alireza; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Hudlicka, Martin; Czech Metrology Institute (CMI), Department of Microwave Measurement, Prague, CZECH REPUBLIC
Yee, See-Khee; Tun-H University (UThM), Johor, MALAYSIA
Salhi, Mohammed; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Allal, Djamel; Laboratoire National de Métrologie et d’Essais, Paris, FRANCE
Kleine-Ostmann, Thomas; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Schrader, Thorsten; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
|
| Quelle/Jahr | IEEE Transactions on Instrumentation and Measurement: 64 (2015), 6, 1438 - 1445 |
| ISSN | 0018-9456 |
| DOI | |
| Verlag | New York, NY: IEEE |
| Konferenzangaben | 29th Conference on Precision Electromagnetic Measurements, Rio de Janeiro, 24-29, August, 2014, Brazil |
| Freie Schlagworte | Material Characterization ; Free-space calibration ; Quasi-optical Setup ; Millimeter and sub-Millimeter waves ; Permittivity ; Uncertainty Budget |
| Zusammenfassung | A compact quasi-optical setup based on conventional rectangular horn antennas and two symmetrical parabolic mirrors is designed to provide a plane wave on the material under test. To measure the scattering parameters at millimeter/sub-millimeter wavelengths, a commercial vector network analyzer (VNA) and waveguide frequency extension units are used. The calibration of the system is performed with a simple practical de-embedding process to determine the S-parameters on the material surface without using high-cost micrometer positioners. A reliable extraction method is presented to derive the material permittivity and calculate the errors and uncertainties as direct functions of the sample and setup geometry and their physical characteristics. Several materials are measured and the complex permittivity is presented together with a detailed uncertainty budget. |
Zitierung
Kazemipour, A., Hudlicka, M., Yee, S.-K., Salhi, M., Allal, D., Kleine-Ostmann, T., & Schrader, T. (2015). Design and calibration of a compact quasi-optical system for material characterization in millimeter/submillimeter wave domain. IEEE Transactions on Instrumentation and Measurement, 64(6), 1438–1445. https://doi.org/10.1109/tim.2014.2376115