| Zugriffsnummer | 33550 |
| Dokumenttyp | Zeitschriftenartikel |
| Sprache | Englisch |
| Titel | Glass and silicon probes: a comparative theoretical study for near-field optical microscopy |
| Autor(in); Institution |
Castiaux, A.; Laboratoire de Physique du Solide, Fac. Univ. Notre-Dame de la Paix, Namur, BELGIUM
Danzebrink, Hans-Ulrich; 5.12, Mikrotopographie, PTB-Braunschweig
Bouju, X.; Laboratoire de Physique Moléculaire, Université de Franche-Comté, Besançon, FRANCE
|
| Quelle/Jahr | Journal of Applied Physics: 84 (1998), 1, 52 - 57 |
| ISSN | 0021-8979 (PRINT) ; 1089-7550 (ONLINE) |
| DOI | |
| Verlag | Melville, NY: AIP |
| Freie Schlagworte | Amorphous metals ; Metallic coatings ; Optical microscopy ; Silicon |
| Zusammenfassung | Glass fibers, chemically etched at their extremities and covered with a thin metalcoating, are often present in near-field optical microscopy. Such elongated systems can be used to either probe the evanescent components of the electromagnetic field at the surface of a sample, or locally couple this sample with optical evanescent waves. In this article, we analyze theoretically an alternative tip design made with a silicon core. This kind of probe could be very useful when infrared properties of a surface are to be investigated. The advantages of using such a material for near-field optical detection will be stressed and compared with the performances of a bulk glass fiber. |
