Zugriffsnummer 33494
Dokumenttyp Konferenzartikel in Zeitschrift
Sprache Englisch
Titel Nonlinearity of the quantum efficiency of Si reflection trap detectors at 633 nm
Autor(in); Institution
Stock, Klaus; 4.11, Radiometrische Einheiten, PTB-Braunschweig
Morozova, S.; All-Russian Research Institute for Optophysical Measurements (VNIIOFI), Moscow, RUSSIA
Liedquist, L.; Swedish National Testing and Research Institute (SP), Borås, SWEDEN
Hofer, Helmut; 4.11, Radiometrische Einheiten, PTB-Braunschweig
Quelle/Jahr Metrologia: 35 (1998), 4, 451 - 454
ISSN 0026-1394 (PRINT) ; 1681-7575 (ONLINE)
DOI
Verlag Bristol [u.a.]: Institute of Physics Publishing (IOP) ; Bureau International des Poids et Mesures
Konferenzangaben 6th International Conference on Radiometry, NEWRAD '97, Tucson, Ariz., 27-29, October, 1997, USA
Klassifikationscode PACS: 06.20.F- ; PACS: 07.60.Dq ; PACS: 85.60.Dw ; PACS: 07.20.Mc
Freie Schlagworte Electronics and devices ; Instrumentation and measurement ; Optics, quantum optics and lasers
Zusammenfassung Trap detectors are useful transfer standards well-suited to modern absolute radiometry. A potential problem with them is that cryogenic radiometers allow only small-diameter laser beams to enter the absorber cavity. This can significantly increase nonlinearity effects of the trap detectors even at radiant power levels below 1 mW. The results of nonlinearity investigations at 633 nm of Si reflection trap detectors are presented. Four types of trap were studied: the commercially available QED100 and QED200, and constructed traps using Hamamatsu S1227-1010BN and S1337-1010BN photodiodes. The quantum efficiency was investigated as a function of radiant power as well as of the bias voltage and beam diameter.

Zitierung

Stock, K., Morozova, S., Liedquist, L., & Hofer, H. (1998). Nonlinearity of the quantum efficiency of Si reflection trap detectors at 633 nm. Metrologia, 35(4), 451–454. https://doi.org/10.1088/0026-1394/35/4/41

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