| Zugriffsnummer | 32601 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Sprache | Englisch |
| Titel | Investigation of conducting organic thin films |
| Autor(in); Institution |
Ebert, Bernd; 10.12, Messtechnik in der Laboratoriumsmedizin, PTB-Berlin; Institute of Molecular Biology, Berlin, GERMANY
Hanke, Th.; Institute of Molecular Biology, Berlin, GERMANY
Boem, I.; TU Chemnitz, Department of Physics and Electronic Devices, Chemnitz, GERMANY
Vollmann, W.; TU Chemnitz, Department of Physics and Electronic Devices, Chemnitz, GERMANY
|
| Quelle/Jahr | Proceedings of the International Conference on Science and Technology of Synthetic Metals. Synthetic Metals: 42 (1991), 1-2, 1957 - 1960 |
| ISSN | 0379-6779 (PRINT) ; 1879-3290 |
| DOI | |
| Verlag | Lausanne: Elsevier Sequoia |
| Konferenzangaben | International Conference on Science and Technology of Synthetic Metals, Tübingen, 2-7, September, 1990, Germany |
| Zusammenfassung | Thin films were prepared from organic charge-transfer complexes by vacuum deposition on glass or NaCl single crystals. It has been shown that the morphology and the conductivity of the polycrystalline thin films depend on surface properties of the substrate, substrate temperature and thickness of the deposited material. EPR spectroscopic data suggest that with increasing thickness the configuration of the polycrystalline matrix changes. The optimum value for the thickness amounts to 60–80 nm. In this range the crystallite arrangement is more homogeneous. |
