Zugriffsnummer 32092
Dokumenttyp Konferenzartikel
Sprache Englisch
Titel A reliable simple method to extract the intrinsic material properties in millimeter/sub-millimeter wave domain
Autor(in); Institution
Kazemipour, Alireza; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Hudlicka, Martin; Czech Metrology Institute (CMI), Department of Microwave Measurement, Prague, CZECH REPUBLIC
Kleine-Ostmann, Thomas; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Schrader, Thorsten; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Quelle/Jahr 29th Conference on Precision Electromagnetic Measurements digest:(2014), 576 - 577
Availability [CD-ROM] ; file name: 288.pdf
ISBN 978-1-4799-2478-3 (CD) ; 978-1-4799-2479-0
Verlag Piscataway, NJ: IEEE Operations Center
Konferenzangaben 29th Conference on Precision Electromagnetic Measurements, Rio de Janeiro, 24-29, August, 2014, Brazil
Freie Schlagworte Material characterization ; Extraction methods ; Multiple reflection ; Fabry-Perot effects ; Measurement uncertainty
Zusammenfassung A simple method is presented to extract the material characteristics from the scattering parameters in the frequency domain. The method is based on "transmission" measurement data only and can give the complex permittivity and/or the absorption and refraction index via easy arithmetic operations with closed-form formulas. Therefore, a parametric error analysis will be feasible for metrological aspects to show important uncertainty contributions. The actual measurements have been performed with a compact quasi-optical free-space setup in the frequency band from 50 GHz to 500 GHz and the detailed results are presented to show the performance of the method.

Zitierung

Kazemipour, A., Hudlicka, M., Kleine-Ostmann, T., & Schrader, T. (2014). A reliable simple method to extract the intrinsic material properties in millimeter/sub-millimeter wave domain. 29th Conference on Precision Electromagnetic Measurements, Rio de Janeiro, 24-29, August, 2014, Brazil.

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