| Zugriffsnummer | 32044 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Absolute intensity measurement of a 100 GHz source using laser-based electro-optic sampling |
| Autor(in); Institution |
Deng, Yuqiang; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Füser, Heiko; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Bieler, Mark; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
|
| Quelle/Jahr | 29th Conference on Precision Electromagnetic Measurements digest:(2014), 748 - 749 |
| Availability | [CD-ROM] ; file name: 374.pdf |
| ISBN | 978-1-4799-2478-3 (CD) ; 978-1-4799-2479-0 |
| Verlag | Piscataway, NJ: IEEE Operations Center |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements (CPEM) 2014, Rio de Janeiro, 24-29, August, 2014, Brazil |
| Freie Schlagworte | Terahertz metrology ; electro-optic sampling ; absolute intensity measurements |
| Zusammenfassung | We report on traceable and spatially resolved intensity measurements of GHz/THz sources using laser-based electro-optic sampling. Traceability of the laser-based setup is achieved by comparison with measurements using a calibrated radiometer. The laser-based setup can be used for characterization of CW and pulsed THz sourced over a broad frequency range. As an application example we measure the spatially resolved intensity profile emitted from a 100 GHz source. |
