| Zugriffsnummer | 32002 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Design considerations for a Si(Li) detector assembly for X-ray microscopy |
| Autor(in); Institution |
Scholze, Frank; 9.23, Vakuum-UV-Strahlungsmeßtechnik, PTB-Berlin; RönTec GmbH i.G., Berlin, GERMANY
Buckley, Christopher J.; Physics Department, King's College London, UK
|
| Quelle/Jahr | X-ray microscopy III : proceedings of the third international conference, London, September 3 - 7, 1990:(1992), 338 - 340 |
| Schriftenreihe | Springer series in optical sciences: 67 |
| Herausgeber(in) |
Michette, Alan G.; Physics Department, King's College London, UK
Morrison, Graeme R.; Physics Department, King's College London, UK
Buckley, Christopher J.; Physics Department, King's College London, UK
|
| ISSN | 0342-4111 |
| ISBN | 978-3-662-13894-6 (print) ; 978-3-540-46887-5 (online) |
| DOI | |
| Verlag | Berlin [u.a.]: Springer |
| Konferenzangaben | X-ray microscopy III, London, September 3-7, 1990, UK |
| Freie Schlagworte | Optics ; Optoelectronics ; Plasmonics and Optical Devices |
| Zusammenfassung | Elemental imaging at high resolution in x-ray microscopy can be achieved using differential absorption contrast in the STXM. However, it is also possible to use fluorescent x-rays for this purpose. To make a high resolution fluorescence microscope practical, a detector covering a large solid angle is needed. A Si(Li) detector with a hole in it is under development. This will be placed between the zone plate and the sample to give good collection efficiency and a low background. |
