| Zugriffsnummer | 32001 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Characterization of soft X-ray detectors |
| Autor(in); Institution |
Kühne, Michael; 9.1, Wärmemeßtechnik und Vakuumphysik, PTB-Berlin
Krumrey, Michael; 9.23, Vakuum-UV-Strahlungsmeßtechnik, PTB-Berlin
Tegeler, Erich; 9.12, Temperaturmeßtechnik, PTB-Berlin
|
| Quelle/Jahr | X-ray microscopy III : proceedings of the third international conference, London, September 3 - 7, 1990:(1992), 321 - 328 |
| Schriftenreihe | Springer series in optical sciences: 67 |
| Herausgeber(in) |
Michette, Alan G.; Physics Department, King's College London, UK
Morrison, Graeme R.; Physics Department, King's College London, UK
Buckley, Christopher J.; Physics Department, King's College London, UK
|
| ISSN | 0342-4111 |
| ISBN | 978-3-662-13894-6 (print) ; 978-3-540-46887-5 (online) |
| DOI | |
| Verlag | Berlin [u.a.]: Springer |
| Konferenzangaben | X-ray microscopy III, London, September 3-7, 1990, UK |
| Freie Schlagworte | Optics ; Optoelectronics ; Plasmonics and Optical Devices |
| Zusammenfassung | At the radiometric laboratory of PTB at the storage ring BESSY, soft X-ray detectors are investigated in the 50 eV to 3.5 keV spectral region. A calibration procedure, based on the radiometric standard source BESSY and on an energy dispersive Si(Li) photon counter, has been developed. Recently available semiconductor photodiodes show high spectral responsivity throughout the full spectral range and are highly stable even in intense radiation. Using a simple model, the absolute spectral responsivity of these detectors can be calculated from the involved layer thicknesses, which can be determined experimentally by investigating the angular dependence of the photocurrent. |
