Zugriffsnummer 31998
Dokumenttyp Konferenzartikel
Sprache Englisch
Titel The optical constants of materials at soft X-ray wavelengths
Autor(in); Institution
Michette, Alan G.; Physics Department, King’s College London, UK
Kühne, Michael; 9.1, Wärmemeßtechnik und Vakuumphysik, PTB-Berlin
Quelle/Jahr X-ray microscopy III : proceedings of the third international conference, London, September 3 - 7, 1990:(1992), 293 - 295
Schriftenreihe Springer series in optical sciences: 67
Herausgeber(in)
Michette, Alan G.; Physics Department, King's College London, UK
Morrison, Graeme R.; Physics Department, King's College London, UK
Buckley, Christopher J.; Physics Department, King's College London, UK
ISSN 0342-4111
ISBN 978-3-662-13894-6 (print) ; 978-3-540-46887-5 (online)
DOI
Verlag Berlin [u.a.]: Springer
Konferenzangaben X-ray microscopy III, London, September 3-7, 1990, UK
Freie Schlagworte Optics ; Optoelectronics ; Plasmonics and Optical Devices
Zusammenfassung High line density transmission gratings have been used to measure the optical constants of contamination carbon (a polymer) in the wavelength range 6–11 nm. The absorption indices are consistent with those derived from the Henke data if the density of contamination carbon is close to that of diamond, but the refractive index decrements are lower than the Henke values.

Zitierung

Michette, A. G. & Kühne, M. (1992). The optical constants of materials at soft X-ray wavelengths. X-ray microscopy III, London, September 3-7, 1990, UK. https://doi.org/10.1007/978-3-540-46887-5_67

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