| Zugriffsnummer | 31344 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Progress report for EMRP Project "High temperature metrology for industrial applications" ; HiTeMS |
| Autor(in); Institution |
Machin, Graham; National Physical Laboratory (NPL), Teddington, UK
Anhalt, Klaus; 7.3, Detektorradiometrie und Strahlungsthermometrie, PTB-Berlin
Edler, Frank; 7.4, Temperatur, PTB-Berlin
Pearce, Jonathan; National Physical Laboratory (NPL), Teddington, UK
Sadli, Mohamed; Laboratoire Commun d Métrologie (LNE-Cnam), Paris, FRANCE
Strnad, Radek; Czech Metrology Insitute (CMI), Praha, CZECH REPUBLIC
Vuelban, Edgar; VSL Dutch Metrology Institute, Delft, THE NETHERLANDS
|
| Quelle/Jahr | Proceedings of the 16th International Congress of Metrology:(2013), 1 - 9 |
| Artikelnummer | 15001 |
| DOI | |
| Verlag | Les Ulis: EDP Sciences |
| Konferenzangaben | International Congress of Metrology, Paris, 7-10, October, 2013, France |
| Zusammenfassung | This paper gives an overview of the progress with the European Metrology Research Programme (EMRP) project “High Temperature Metrology for Industrial Applications” (HiTeMS). The objective of the project is to address, on a broad front, a number of unsolved measurement challenges in the domain of high temperatures above 1000 °C, both in non-contact and contact thermometry. It brings together a total of 15 partner organisations; National Measurement Institutes (NMIs) (10), industrial companies (4) and a Fraunhofer Institute. The project started in September 2011 and will end in August 2014, though it is envisaged that the developments started here will have impact on industrial high temperature measurement long after the project is completed. |
| Kostenfreier Zugang | Freier Zugang |
| Rechteinformation | CC BY 2.0 ; Creative Commons Attribution 2.0 License |
Zitierung
Machin, G., Anhalt, K., Edler, F., Pearce, J., Sadli, M., Strnad, R., & Vuelban, E. (2013). Progress report for EMRP Project "High temperature metrology for industrial applications" ; HiTeMS. International Congress of Metrology, Paris, 7-10, October, 2013, France. https://doi.org/10.1051/metrology/201315001