| Zugriffsnummer | 31324 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Microwave substrate loss tangent extraction from coplanar waveguide measurements up to 125 GHz |
| Autor(in); Institution |
Arz, Uwe; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
|
| Quelle/Jahr | 83rd ARFTG Microwave Measurement Conference (ARFTG) ; in: 2014 IEEE MTT-S International Microwave Symposium digest:(2014), 137 - 139 |
| ISBN | 978-1-4799-4425-5 ; 978-1-4799-3868-1 |
| DOI | |
| Verlag | Piscataway, NJ: IEEE Service Center |
| Konferenzangaben | 83rd ARFTG Microwave Measurement Conference (ARFTG), Tampa, Florida, 06, June, 2014, USA |
| Zusammenfassung | We present a semi-numerical method to extract the loss tangent of a low-loss microwave substrate material from on-wafer scattering-parameter measurements of coplanar waveguides of different lengths. We demonstrate the method using test structures built on a SiO2 wafer for frequencies up to 125 GHz. |
