| Zugriffsnummer | 30692 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | THz Metrology |
| Autor(in); Institution |
Kleine-Ostmann, Thomas; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
|
| Quelle/Jahr | IRMMW-THz 2013, the 38th International Conference on Infrared, Millimeter, and Terahertz Wave:(2013), 4 S. |
| Availability | [USB-Stick] ; file name: FR_PL_1.pdf |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | The 38th International Conference on Infrared, Milimeter and Terahertz Waves (IRMMW-THz 2013), Mainz, 01-06, September, 2013, Germany |
| Freie Schlagworte | THz Metrology ; THz Time-Domain Spectroscopy ; Vector Network Analysis ; THz Radiometry |
| Zusammenfassung | The term metrology refers to the art and science of measurement. In the last three hundred years approaches and tools have been developed that allow for precise and reliable measurements with known measurement uncertainty in a multitude of disciplines in physics and technology. Trust in measurement results, comparability and interoperability are crucial for technology in everyday life. With the advent of THz science and technology new sophisticated measurement techniques have been developed that allow for insights that cannot be obtained otherwise. By now commercial systems making use of THz radiation are appearing on the market and the question of the reliability of measurements becomes increasingly important. |
