Zugriffsnummer 30024
Dokumenttyp Konferenzartikel
Peer Review unbekannt
Sprache Englisch
Titel AIM QuTE: Automated impedance metrology extending the quantum toolbox for electricity
Autor(in); Institution
Palafox Gamir, Luis; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Raso, Félix; Centro Español de Metrología, Tres Cantos, Madrid, SPAIN
Kucera, Jan; Cesky Metrologicky Institut (CMI), Brno, CZECH REPUBLIC
Overney, Frederic; Swiss Federal Office of Metrology (METAS), Bern-Wabern, SWITZERLAND
Callegaro, Luca; Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, ITALY
Gournay, Pierre; Laboratoire National de Métrologie et d’Essais (LNE), Trappes Cedex, FRANCE
Ziolek, Adam; Glówny Urzad Miar (GUM), Warszawa, POLAND
Nissilä, Jaani; MIKES, Espoo, FINLAND
Eklund, G.; SP Technical Research Institute of Sweden, Borås, SWEDEN
Lippert, Torsten; Trescal A-S, Silkeborg, DENMARK
Gülmez, Yakup; Turkiye Bilimsel ve Teknolojik Arastirma Kurumu (TÜBITAK), Ulusal Metroloji Enstitüsü (UME), Ankara, TURKEY
Fleischmann, P.; esz AG calibration & metrology, Eichenau, GERMANY
Kampik, M.; Politechnika Slaska, Gliwice, POLAND
Rybski, R.; Uniwersytet Zielonogorski, Zielona Góra, POLAND
Quelle/Jahr 16th International Congress of Metrology:(2013), 3 S.
Availability [Online only] 11001
DOI
Verlag Paris: EDP Sciences
Konferenzangaben 16th International Congress of Metrology, Paris, 07-10, October, 2013, France
Zusammenfassung The "Automated impedance metrology extending the quantum toolbox for electricity" project (AIM QuTE) will extend Josephson impedance bridges capabilities to the whole complex plane with the best level of uncertainties (0.05 ppm). In parallel, fully digital bridges will be developed to reduce the operator workload imposed on national metrology institutes for the realisation of the impedances scales and for calibrations. The target level of uncertainty for these fully digital bridges is parts in 10−7. Furthermore, sub-pF standards will be developed to establish traceability of very small capacitances. An electronic impedance simulator, which will cover a very large region of the complex impedance plane, will also be realised, it will significantly reduce the number of standards required to link traceability of top level calibration laboratories to national metrology institutes.

Zitierung

Palafox Gamir, L., Raso, F., Kucera, J., Overney, F., Callegaro, L., Gournay, P., Ziolek, A., Nissilä, J., Eklund, G., Lippert, T., Gülmez, Y., Fleischmann, P., Kampik, M., & Rybski, R. (2013). AIM QuTE: Automated impedance metrology extending the quantum toolbox for electricity. 16th International Congress of Metrology, Paris, 07-10, October, 2013, France. http://doi.org/10.1051/metrology/201311001

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