Zugriffsnummer 29931
Dokumenttyp Konferenzartikel
Sprache Englisch
Titel Analysis of surface topography by maximum entropy power spectrum estimation
Autor(in); Institution
Oganesian, G.; Technical University of Armenia, Jerewan, ARMENIA
Hasche, Klaus; 5.2, Industrielle Meßtechnik, PTB-Braunschweig
Moeck, Hartmut; 8.3, Metrologische Informationstechnik, PTB-Berlin
Quelle/Jahr Advanced mathematical tools in metrology III:(1997), 274 - 276
Schriftenreihe Series on advances in mathematics for applied sciences: 45
Herausgeber(in)
Ciarlini, P.; CNR - Instituto di Applicazione del Calcolo, Roma, ITALY
Cox, M.G.; National Physical Laboratory, Teddington, UK
Pavese, F.; CNR - Instituto di Metrologia, Torino, ITALY
Richter, Dieter; 8.3, Metrologische Informationstechnik, PTB-Berlin
ISBN 981-02-2918-6
Verlag Singapore [u.a.]: World Scientific
Konferenzangaben Advanced Mathematical Tools in Metrology III, Berlin, September, 1996, Germany
Zusammenfassung The maximum entropy method is used to estimate of two-dimensional power spectra. The work is based on an algorithm given by Lim and Malik. The estimation serves the analysis of data obtained in surface topography measurements.

Zitierung

Oganesian, G., Hasche, K., & Moeck, H. (1997). Analysis of surface topography by maximum entropy power spectrum estimation. Advanced Mathematical Tools in Metrology III, Berlin, September, 1996, Germany.

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