Zugriffsnummer 29632
Dokumenttyp Konferenzartikel in Zeitschrift
Sprache Englisch
Titel Adaptive acquisition of power IGBT transients with discrimination circuit
Autor(in); Institution
Ermel, Vladimir; TU Braunschweig, Institute for High Voltage Technology and Electrical Power Systems, Braunschweig, GERMANY
Meisner, Johann; 2.3, Elektrische Energiemesstechnik, PTB-Braunschweig
Kurrat, Michael; TU Braunschweig, Institute for High Voltage Technology and Electrical Power Systems, Braunschweig, GERMANY
Kahmann, Martin; 2.3, Elektrische Energiemesstechnik, PTB-Braunschweig
Quelle/Jahr Third IEEE International Workshop on Applied Measurements for Power Systems (AMPS). IEEE Transactions on Instrumentation and Measurement: 62 (2013), 9, 2364 - 2371
ISSN 0018-9456
DOI
Verlag New York, NY: IEEE
Konferenzangaben Third IEEE International Workshop on Applied Measurements for Power Systems (AMPS), Aachen, 26-28, September, 2012, Germany
Freie Schlagworte converters ; discriminator ; insulated gate bipolar transistor (IGBT) ; measurement ; voltage transients
Zusammenfassung The frequency spectrum of the power insulated gate bipolar transistor (IGBT) circuit originates mostly from high gradient switching and low rate conduction components. High gradient transients are captured with direct probes. Switching losses are represented with 3-D surfaces acquired with Delaunay triangulation processing. Interpolation functions are introduced, allowing the prediction of the switching loss in the entire 3-D space. A chopper circuit is introduced for the acquisition of the IGBT low rate transients in the conductive stage of operation. A Zener discriminator enhances the measurement accuracy by two orders of magnitude. The experimental results are presented for a half-bridge converter. Measurement uncertainties are acquired with dc and impulse calibration apparatuses.

Zitierung

Ermel, V., Meisner, J., Kurrat, M., & Kahmann, M. (2013). Adaptive acquisition of power IGBT transients with discrimination circuit. IEEE Transactions on Instrumentation and Measurement, 62(9), 2364–2371. https://doi.org/10.1109/tim.2013.2272395

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