| Zugriffsnummer | 29418 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Methods for dynamic quality tests of ad-modules and microcontrollers with integrated ad-converters |
| Autor(in); Institution |
Haasz, Vladimir; Czech Technical University in Prague, Dept. of Measurement, Faculty of Electrical Eng., Prague, CZECH REPUBLIC
Schumny, Harald; 8.3, Metrologische Informationstechnik, PTB-Berlin
|
| Quelle/Jahr | 10th International Symposium on Developement in Digital Measuring Instrumentation (ISDDMI) : 3rd Workshop on ADC Modelling and Testing. Proceedings. Vol. 1:(1998), 419 - 423 |
| Herausgeber(in) |
Daponte, P.
|
| Verlag | Wien: IMEKO, Austrian Society for Measurement and Automation |
| Konferenzangaben | ISDDMI 98, 10th International Symposium on Development in Digital Measuring Instrumentation and 3rd Workshop on ADC Modelling and Testing, Naples, 17-18, September, 1998, Italy |
| Freie Schlagworte | AD-modules ; testing ; dynamic quality ; number of effective bits ; disturbance |
| Zusammenfassung | Systems using various types of AD-modules or microcontrollers with integrated AD-converters are frequently used for dynamic measurements. To estimate the error of dynamic signals measurement, the dynamic quality of AD-module must be known. This paper describes methods for determination of dynamic parameters of AD-modules and their dependence on disturbing fields. An experimental verification of the these methods was also made and some concrete results are published here. |
Zitierung
Haasz, V. & Schumny, H. (1998). Methods for dynamic quality tests of ad-modules and microcontrollers with integrated ad-converters. ISDDMI 98, 10th International Symposium on Development in Digital Measuring Instrumentation and 3rd Workshop on ADC Modelling and Testing, Naples, 17-18, September, 1998, Italy.